IEEE - Institute of Electrical and Electronics Engineers, Inc. - Easy and accurate empirical transistor model parameter estimation from vectorial large-signal measurements

1999 IEEE MTT-S International Microwave Symposium Digest

Author(s): D. Schreurs ; J. Verspecht ; S. Vandenberghe ; G. Carchon ; K. van der Zanden ; B. Nauwelaers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Anaheim, CA, USA, USA
Conference Date: 13 June 1999
Volume: 2
Page Count: 4
ISBN (Paper): 0-7803-5135-5
DOI: 10.1109/MWSYM.1999.779869
Regular:

The standard empirical nonlinear model parameter estimation is often cumbersome as several measurement systems are involved. We show that the model generation complexity can be reduced... View More

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