IEEE - Institute of Electrical and Electronics Engineers, Inc. - AR-SMT: a microarchitectural approach to fault tolerance in microprocessors

Proceedings of the 29th Annual International Symposium on Fault-Tolerant Computing

Author(s): Rotenberg, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Madison, WI, USA, USA
Conference Date: 15 June 1999
Page(s): 84 - 91
ISBN (Paper): 0-7695-0213-X
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1999.781037
Regular:

This paper speculates that technology trends pose new challenges for fault tolerance in microprocessors. Specifically, severely reduced design tolerances implied by gigaherz clock rates may result... View More

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