IEEE - Institute of Electrical and Electronics Engineers, Inc. - An algorithm based error detection scheme for the multigrid algorithm

Proceedings of the 29th Annual International Symposium on Fault-Tolerant Computing

Author(s): A. Mishra ; P. Banerjee
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Fault-Tolerant Comput.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Madison, WI, USA, USA
Conference Date: 15 June 1999
Page Count: 9
Page(s): 12 - 19
ISBN (Paper): 0-7695-0213-X
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1999.781029
Regular:

In this paper an Algorithm Based Error Detection (ABED) scheme is applied to the multigrid algorithm which provides an iterative solution to a system of linear algebraic equations resulting from a... View More

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