IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fuzzy models and potential outliers

Proceedings of NAFIPS-99: 18th International Conference of the North American Fuzzy Information Processing Society

Author(s): Berthold, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: New York, NY, USA, USA
Conference Date: 10 June 1999
Page(s): 532 - 535
ISBN (Paper): 0-7803-5211-4
DOI: 10.1109/NAFIPS.1999.781750
Regular:

Outliers or distorted attributes very often severely interfere with data analysis algorithms that try to extract few meaningful rules. Most methods to deal with outliers try to completely ignore... View More

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