IEEE - Institute of Electrical and Electronics Engineers, Inc. - Landscape metrics as a tool for the analysis of spatial structures in classified satellite images

IEEE 1999 International Geoscience and Remote Sensing Symposium. IGARSS'99

Author(s): Gasper, P. ; Menz, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Hamburg, Germany, Germany
Conference Date: 28 June 1999
Volume: 1
ISBN (Paper): 0-7803-5207-6
DOI: 10.1109/IGARSS.1999.773426
Regular:

In quantitative landscape ecology landscape metrics were developed to describe spatial patterns in classified images. These indices allow the realization and representation of environmental... View More

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