IEEE - Institute of Electrical and Electronics Engineers, Inc. - Direct parameter extraction techniques for a new poly-Si TFT model

Proceedings of International Conference on Microelectronic Test Structures

Author(s): Iniguez, B. ; Xu, Z. ; Fjeldly, T. ; Shur, M.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Goteborg, Sweden, Sweden
Conference Date: 15 March 1999
Page(s): 216 - 221
ISBN (Paper): 0-7803-5270-X
DOI: 10.1109/ICMTS.1999.766247
Regular:

We describe direct extraction techniques for the most important parameters of a new physics-based polysilicon (poly-Si) TFT model, suitable for circuit simulation. The physics-based model covers... View More

Advertisement