IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inclusion of substrate effects in the flyback method for BJT resistance characterisation

Proceedings of International Conference on Microelectronic Test Structures

Author(s): MacSweeney, D. ; McCarthy, K. ; Mathewson, A. ; Power, J.A. ; Kelly, S.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Goteborg, Sweden, Sweden
Conference Date: 15 March 1999
Page(s): 194 - 199
ISBN (Paper): 0-7803-5270-X
DOI: 10.1109/ICMTS.1999.766242
Regular:

In this paper, the effect of the substrate interaction is examined for the R/sub E/ flyback method which is commonly used to measure the emitter resistance of BJT devices. By considering the... View More

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