IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated generation of SPICE characterization test masks and test databases

Proceedings of International Conference on Microelectronic Test Structures

Author(s): Kasel, L. ; McAndrew, C.C. ; Drennan, P. ; Davis, W.F. ; Ida, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Goteborg, Sweden, Sweden
Conference Date: 15 March 1999
Page(s): 74 - 79
ISBN (Paper): 0-7803-5270-X
DOI: 10.1109/ICMTS.1999.766219
Regular:

This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and... View More

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