IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of micro-electronic test structures for noise measurement verification

Proceedings of International Conference on Microelectronic Test Structures

Author(s): Van den Bosch, S. ; De Ketalaere, W. ; Martens, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Goteborg, Sweden, Sweden
Conference Date: 15 March 1999
Page(s): 40 - 44
ISBN (Paper): 0-7803-5270-X
DOI: 10.1109/ICMTS.1999.766213
Regular:

For the first time, four devices proposed in the literature for noise measurement verification are compared on the same basis. We present measured and simulated standard deviations of extracted... View More

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