IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new test structure for direct extraction of SPICE model parameters for double polysilicon bipolar transistors

Proceedings of International Conference on Microelectronic Test Structures

Author(s): Sanden, M. ; Shi-Li Zhang ; Grahn, J.V. ; Ostling, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Goteborg, Sweden, Sweden
Conference Date: 15 March 1999
Page(s): 30 - 33
ISBN (Paper): 0-7803-5270-X
DOI: 10.1109/ICMTS.1999.766211
Regular:

Direct extraction of ten core SPICE model parameters for double polysilicon bipolar junction transistors (BJTs) was performed using a new test structure. The test structure was basically identical... View More

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