IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ultra-high resolution temperature measurement and thermal management of RF power devices using heat pipes

11th International Symposium on Power Semiconductor Devices and ICs. ISPSD '99

Author(s): Jun He ; Mehrotra, V. ; Shaw, M.C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Toronto, Ont., Canada, Canada
Conference Date: 26 May 1999
Page(s): 145 - 148
ISBN (Paper): 0-7803-5290-4
ISSN (Paper): 1063-6854
DOI: 10.1109/ISPSD.1999.764083
Regular:

A new technique, designated pyrospectroscopy, for measuring temperatures with ultra-high resolution in semiconductor devices is demonstrated. This technique is based on Raman spectroscopy and... View More

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