IEEE - Institute of Electrical and Electronics Engineers, Inc. - Explosion tests on IGBT high voltage modules

11th International Symposium on Power Semiconductor Devices and ICs. ISPSD '99

Author(s): Gekenidis, S. ; Ramezani, E. ; Zeller, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Toronto, Ont., Canada, Canada
Conference Date: 26 May 1999
Page(s): 129 - 132
ISBN (Paper): 0-7803-5290-4
ISSN (Paper): 1063-6854
DOI: 10.1109/ISPSD.1999.764079
Regular:

In this paper, we report on surge current experiments with IGBT modules in low inductance, snubberless circuits. We give design guidelines for robust modules and robust converter designs, discuss... View More

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