IEEE - Institute of Electrical and Electronics Engineers, Inc. - Creation and evaluation of compact models for thermal characterisation using dedicated optimisation software

Fifteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. SEMI-THERM. Proceedings 1999

Author(s): Lasance, C.J.M. ; Den Hertog, D. ; Stehouwer, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: San Diego, CA, USA, USA
Conference Date: 9 March 1999
Page(s): 189 - 200
ISBN (Paper): 0-7803-5264-5
ISSN (Paper): 1065-2221
DOI: 10.1109/STHERM.1999.762447
Regular:

The collaborative European project DELPHI, completed in November 1996, was concerned with the creation and experimental validation of thermal models for a range of electronic parts. Many DELPHI... View More

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