IEEE - Institute of Electrical and Electronics Engineers, Inc. - ADOLT-An ADaptable On-Line Testing scheme for VLSI circuits

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Maamar, A. ; Russell, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 770 - 771
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761223
Regular:

ADOLT permits the error detection capabilities of a CED scheme to be adapted to the error detection requirements of an application. This reduces the impact of the scheme on the design in terms of... View More

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