IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-chip transient current monitor for testing of low-voltage CMOS IC

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Stopjakova, V. ; Manhaeve, H. ; Sidiropulos, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 538 - 542
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761179
Regular:

In this paper, on-chip test circuitry performing the transient supply current measurement is presented. The introduced principle makes uses of the parasitic resistance of the supply connection to... View More

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