IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parametric built-in self-test of VLSI systems

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Niggemeyer, D. ; Ruffer, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 376 - 380
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761149
Regular:

Conventionally, Automatic Test Equipment (ATE) has been used for parametric tests of VLSI systems to determine the influence of clock speed, supply voltage, and temperature on the specified... View More

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