IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the design of self-checking functional units based on Shannon circuits

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Favilli, M. ; Metra, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 368 - 375
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761148
Regular:

This paper investigates the application of Shannon (BDD) circuits, that feature interesting low-power capabilities, to the design of self-checking functional units. A technique is proposed that,... View More

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