IEEE - Institute of Electrical and Electronics Engineers, Inc. - Minimal length diagnostic tests for analog circuits using test history

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Gomes, A.V. ; Chatterjee, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 189 - 194
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761120
Regular:

In this paper we propose an efficient transient test generation method to comprehensively test analog circuits using minimum test time. A divide and conquer strategy is formulated to sequentially... View More

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