IEEE - Institute of Electrical and Electronics Engineers, Inc. - A method to diagnose faults in linear analog circuits using an adaptive tester

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Cota, E.F. ; Carro, L. ; Lubaszewski, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 184 - 188
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761119
Regular:

This work presents a new diagnosis method for use in an adaptive analog tester. The tester is able to detect faults in any linear circuit by learning a reference behaviour in a first step, and... View More

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