IEEE - Institute of Electrical and Electronics Engineers, Inc. - Peak power estimation using genetic spot optimization for large VLSI circuits

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Hsiao, M.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 175 - 179
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761115
Regular:

Estimating peak power involves optimization of the circuit's switching function. We propose genetic spot expansion and optimization in this paper to estimate tight peak power bounds for large... View More

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