IEEE - Institute of Electrical and Electronics Engineers, Inc. - On reducing transitions through data modifications

Design, Automation and Test in Europe Conference and Exhibition, 1999. Proceedings

Author(s): Murgai, R. ; Fujita, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Munich, Germany, Germany
Conference Date: 9 March 1999
Page(s): 82 - 88
ISBN (Paper): 0-7695-0078-1
DOI: 10.1109/DATE.1999.761101
Regular:

Since busses take up a significant fraction of chip-area, the bus capacitances are often considerable, and the bus power may account for as much as 40% of the total power consumed on the chip. In... View More

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