IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transistor stuck-open fault detection in multilevel CMOS circuits

Proceedings Ninth Great Lakes Symposium on VLSI

Author(s): Abd-El-Barr, M. ; Yanging Xu ; McCrosky, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Ypsilanti, MI, USA, USA
Conference Date: 4 March 1999
Page(s): 388 - 391
ISBN (Paper): 0-7695-0104-4
ISSN (Paper): 1066-1395
DOI: 10.1109/GLSV.1999.757464
Regular:

The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multilevel CMOS circuits are shown. A method for representing a two-pattern test for detecting a... View More

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