IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise immunity of digital circuits in mixed-signal smart power systems

Proceedings Ninth Great Lakes Symposium on VLSI

Author(s): Secareanu, R.M. ; Kourtev, I.S. ; Becerra, J. ; Watrobski, T.E. ; Morton, C. ; Staub, W. ; Tellier, T. ; Friedman, E.G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Ypsilanti, MI, USA, USA
Conference Date: 4 March 1999
Page(s): 314 - 317
ISBN (Paper): 0-7695-0104-4
ISSN (Paper): 1066-1395
DOI: 10.1109/GLSV.1999.757441
Regular:

Experimental data describing circuit and physical design issues that influence the noise immunity of digital latches in mixed-signal smart power circuits are described and discussed. The principal... View More

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