IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault coverage estimation for early stage of VLSI design

Proceedings Ninth Great Lakes Symposium on VLSI

Author(s): Von-Kyoung Kim ; Chen, T. ; Tegethoff, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Ypsilanti, MI, USA, USA
Conference Date: 4 March 1999
Page(s): 105 - 108
ISBN (Paper): 0-7695-0104-4
ISSN (Paper): 1066-1395
DOI: 10.1109/GLSV.1999.757387
Regular:

This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with three parameters,... View More

Advertisement