IEEE - Institute of Electrical and Electronics Engineers, Inc. - S2P: a stable 2-pole RC delay and coupling noise metric [IC interconnects]

Proceedings Ninth Great Lakes Symposium on VLSI

Author(s): Acar, E. ; Odabasioglu, A. ; Celik, M. ; Pileggi, L.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Ypsilanti, MI, USA, USA
Conference Date: 4 March 1999
Page(s): 60 - 63
ISBN (Paper): 0-7695-0104-4
ISSN (Paper): 1066-1395
DOI: 10.1109/GLSV.1999.757377
Regular:

The Elmore delay is the metric of choice for performance-driven design applications due to its simple, explicit form and ease with which sensitivity information can be calculated. However, for... View More

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