IEEE - Institute of Electrical and Electronics Engineers, Inc. - Noise margin constraints for interconnectivity in deep submicron low power and mixed-signal VLSI circuits

Proceedings 20th Anniversary Conference on Advanced Research in VLSI

Author(s): Li-Rong Zheng ; Tenhunen, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1999
Conference Location: Atlanta, GA, USA, USA
Conference Date: 21 March 1999
Page(s): 123 - 136
ISBN (Paper): 0-7695-0056-0
ISSN (Paper): 1522-869X
DOI: 10.1109/ARVLSI.1999.756043
Regular:

The continually growth in density and complexity of integrated circuits gives a difficult challenge in wireability of deep submicron VLSI circuits, particularly the advanced low power and... View More

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