IEEE - Institute of Electrical and Electronics Engineers, Inc. - Proximity coupled T-junctions using parasitic element

Proceedings of International Conference on Microwave and Millimeter Wave Technology

Author(s): Arai, H. ; Matsuzaki, T. ; Itoh, T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Beijing, China, China
Conference Date: 18 August 1998
Page(s): 849 - 852
ISBN (Paper): 0-7803-4308-5
DOI: 10.1109/ICMMT.1998.768422
Regular:

This paper presents proximity coupled microstrip line T-junctions using a parasitic element for application as a DC free junction with highly isolated output branches. A parasitic patch resonator... View More

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