IEEE - Institute of Electrical and Electronics Engineers, Inc. - Brief introduction to an automatic measurement system for plotting Rieke diagram

Proceedings of International Conference on Microwave and Millimeter Wave Technology

Author(s): Wei Yixue ; Zhang Zhaotang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Beijing, China, China
Conference Date: 18 August 1998
Page(s): 795 - 798
ISBN (Paper): 0-7803-4308-5
DOI: 10.1109/ICMMT.1998.768409
Regular:

A fast automatic measurement method of Rieke diagram that shows the output character of a microwave tube is put forward in this paper. One advanced principle and idea was presented to scan the... View More

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