IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microwave studies of electron-impurity scattering in semiconductors through cyclotron resonance

Proceedings of International Conference on Microwave and Millimeter Wave Technology

Author(s): Otsuka, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Beijing, China, China
Conference Date: 18 August 1998
Page(s): 694 - 697
ISBN (Paper): 0-7803-4308-5
DOI: 10.1109/ICMMT.1998.768384
Regular:

Electron cyclotron resonance is studied by microwaves both in n-type and p-type semiconductors. The atomic scattering models for electron and positron have been found very useful in analyzing the... View More

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