IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effects of drain current kinks and negative gate resistances on the performance of HFET MMIC power amplifiers

1998 GaAs Reliability Workshop. Proceedings

Author(s): Ce-Jun Wei ; Hwang, J.C.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Atlanta, GA, USA, USA
Conference Date: 1 November 1998
Page(s): 36 - 39
ISBN (Paper): 0-7908-0065-9
DOI: 10.1109/GAASRW.1998.768033
Regular:

Using novel characterization techniques, frequency-sensitive gain/phase discontinuities of multi-stage MMIC power amplifiers were correlated with HFET drain current kinks and negative gate... View More

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