IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process reliability qualification experiences during a fab relocation

1998 GaAs Reliability Workshop. Proceedings

Author(s): Roesch, W.J. ; Bumgarner, S. ; Monaghan, L.O. ; Rubalcava, T. ; Riley, D. ; Cruse, D. ; Cartwright, J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Atlanta, GA, USA, USA
Conference Date: 1 November 1998
Page(s): 19 - 25
ISBN (Paper): 0-7908-0065-9
DOI: 10.1109/GAASRW.1998.768031
Regular:

The intent of this work is to provide information on the methodology, implementation, and results of reliability assessments enacted as part of new facility qualification. Three major processes... View More

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