IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pico-microammeter

1998 4th International Conference on Actual Problems of Electronic Instrument Engineering Proceedings. APEIE-98

Author(s): Orehov, A.P. ; Averjanov, V.I.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Novosibirsk, Russia, Russia
Conference Date: 23 September 1998
Page(s): 232 - 233
ISBN (Paper): 0-7803-4938-5
DOI: 10.1109/APEIE.1998.768954
Regular:

The paper describes a low-profile device with two-batteries feeding. The log transformation range is 10/sup -12/-10/sup -6/ A. The current measurement error for 1 /spl mu/A does not exceed 1,5%,... View More

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