IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical heterodyne force microscopy

1998 IEEE Ultrasonics Symposium. Proceedings

Author(s): Kumano, N. ; Inagaki, K. ; Kolosov, O.V. ; Wright, O.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Sendai, Japan, Japan
Conference Date: 5 October 1998
Volume: 2
ISBN (Paper): 0-7803-4095-7
ISSN (Paper): 1051-0117
DOI: 10.1109/ULTSYM.1998.765070
Regular:

We present a new technique, Optical Heterodyne Force Microscopy, that allows local probing of photothermally-induced ultrasonic vibrations of a sample surface. We demonstrate with images of... View More

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