IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic measurement of surface properties with ripplon spectroscopy

1998 IEEE Ultrasonics Symposium. Proceedings

Author(s): Mizuno, D. ; Hattori, K. ; Sakai, K. ; Takagi, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Sendai, Japan, Japan
Conference Date: 5 October 1998
Volume: 2
ISBN (Paper): 0-7803-4095-7
ISSN (Paper): 1051-0117
DOI: 10.1109/ULTSYM.1998.765035
Regular:

Ripplon light scattering technique was applied for the investigation of the mechanical properties of the surface of surfactant solution. The velocity and damping constant of the ripplon were... View More

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