IEEE - Institute of Electrical and Electronics Engineers, Inc. - Nondestructive evaluation of defect in optically opaque material by polyvinylidene difluoride film sensor

1998 IEEE Ultrasonics Symposium. Proceedings

Author(s): Minamide, A. ; Tokunaga, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Sendai, Japan, Japan
Conference Date: 5 October 1998
Volume: 1
ISBN (Paper): 0-7803-4095-7
ISSN (Paper): 1051-0117
DOI: 10.1109/ULTSYM.1998.762280
Regular:

In this paper, we propose an one-dimensional model to analyze a photopyroelectric signal of optically opaque materials measured by a polyvinylidene difluoride (PVDF) film sensor in a thermal wave... View More

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