IEEE - Institute of Electrical and Electronics Engineers, Inc. - Film thickness dependence on frequency-temperature characteristics for AT-cut bar resonators

Proceedings of the 1998 IEEE International Frequency Control Symposium (Cat. No.98CH36165)

Author(s): Nakazawa, M. ; Yamamoto, F. ; Sawai, D. ; Kadosaki, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Pasadena, CA, USA
Conference Date: 29 May 1998
Page(s): 968 - 974
ISBN (Paper): 0-7803-4373-5
ISSN (Paper): 1075-6787
DOI: 10.1109/FREQ.1998.718017
Regular:

Analysis and experimental results regarding frequency temperature vs. electrode film thickness characteristics for AT cut bar resonators are described. A quadric relationship between frequency... View More

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