IEEE - Institute of Electrical and Electronics Engineers, Inc. - X-ray diffraction topography analysis of TS-TT vibrations in contoured AT-cut quartz resonators

Proceedings of the 1998 IEEE International Frequency Control Symposium (Cat. No.98CH36165)

Author(s): Slavov, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Pasadena, CA, USA
Conference Date: 29 May 1998
Page(s): 836 - 843
ISBN (Paper): 0-7803-4373-5
ISSN (Paper): 1075-6787
DOI: 10.1109/FREQ.1998.717997
Regular:

The coupled thickness-shear and thickness-twist (TS-TT) modes of vibration in AT-cut quartz resonators are studied through comparison of theoretically predicted frequencies and mode's shape with... View More

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