IEEE - Institute of Electrical and Electronics Engineers, Inc. - Behavioral fault simulation of large mixed-signal UUTs using the Saber simulator

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)

Author(s): Majernik, D. ; Siegel, C. ; Somanchi, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Salt Lake City, UT, USA, USA
Conference Date: 25 August 1998
Page(s): 600 - 605
ISBN (Paper): 0-7803-4420-0
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.1998.713504
Regular:

The use of behavioral simulation in the design of large printed circuit boards and systems is well known. Using behavioral models of complex or large circuitry in a top-down design methodology,... View More

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