IEEE - Institute of Electrical and Electronics Engineers, Inc. - Application of VHDL in test program development

1998 IEEE AUTOTESTCON Proceedings. IEEE Systems Readiness Technology Conference. Test Technology for the 21st Century (Cat. No.98CH36179)

Author(s): Sacher, E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Salt Lake City, UT, USA, USA
Conference Date: 25 August 1998
Page(s): 14 - 21
ISBN (Paper): 0-7803-4420-0
ISSN (Paper): 1088-7725
DOI: 10.1109/AUTEST.1998.713414
Regular:

Writing functional test programs has been a pervasive task since the inception of computer controlled testing in the early seventies. Software tools have been developed, such as simulators and... View More

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