IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dielectric characterization of microwave assisted chemically vapor deposited diamond

Proceedings of the IEEE 1998 National Aerospace and Electronics Conference NAECON 1998. Celebrating 50 Years

Author(s): Heidger, S. ; Fries-Carr, S. ; Weimer, J. ; Jordan, B. ; Wu, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Dayton, OH, USA, USA
Conference Date: 17 July 1998
Page(s): 247 - 254
ISBN (Paper): 0-7803-4449-9
ISSN (Paper): 0547-3578
DOI: 10.1109/NAECON.1998.710124
Regular:

Freestanding polycrystalline diamond films produced by Microwave Plasma Chemical Vapor Deposition (MWCVD) were investigated for high power and high temperature electronic applications. The diamond... View More

Advertisement