IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test tools for the Year 2000 challenges

Proceedings 24th EUROMICRO Conference

Author(s): Leung, H.K.N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Vasteras, Sweden, Sweden
Conference Date: 27 August 1998
Volume: 2
ISBN (Paper): 0-8186-8646-4
ISSN (Paper): 1089-6503
DOI: 10.1109/EURMIC.1998.708109
Regular:

A successful conversion strategy for the Year 2000 problem should include an effective testing strategy that involves the use of automated tools. The paper first identifies the testing problems... View More

Advertisement