IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-feature matching algorithm for free-form 3D surface registration

Proceedings Fourteenth International Conference on Pattern Recognition

Author(s): Schutz, C. ; Jost, T. ; Hugli, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: Brisbane, Queensland, Australia, Australia
Conference Date: 20 August 1998
Volume: 2
ISBN (Paper): 0-8186-8512-3
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.1998.711852
Regular:

Applications such as object digitizing, object recognition and object inspection need efficient surface matching algorithms. Several variants of an iterative closest point (ICP) matching algorithm... View More

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