IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved analytical yield evaluation method for redundant RAM's

Proceedings International Workshop on Memory Technology, Design and Testing

Author(s): Battaglini, G. ; Ciciani, B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1998
Conference Location: San Jose, CA, USA, USA
Conference Date: 25 August 1998
Page(s): 117 - 123
ISBN (Paper): 0-8186-8494-1
DOI: 10.1109/MTDT.1998.705957
Regular:

A new stochastic method is introduced for calculating the manufacturing field of fault-tolerant VLSI/WSI systems. This method is an improvement on a previous method based on a Markov chain. This... View More

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