IEEE - Institute of Electrical and Electronics Engineers, Inc. - Self-detectable serial test vector for short circuit fault detection

Proceedings of 1st International Conference on Information Communications and Signal Processing

Author(s): Kyongho Han ; Hyun-Do Nam
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore, Singapore
Conference Date: 12 September 1997
Volume: 2
ISBN (Paper): 0-7803-3676-3
DOI: 10.1109/ICICS.1997.652185
Regular:

The design of the maximum number of serial test vectors is proposed for the detection of the short circuit faults of the interconnect wires. The interconnect wires of the circuit board is... View More

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