IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect detection by recursive filters in packaging industry

Proceedings of 1st International Conference on Information Communications and Signal Processing

Author(s): Caron, J. ; Duvieubourg, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore, Singapore
Conference Date: 12 September 1997
Volume: 2
ISBN (Paper): 0-7803-3676-3
DOI: 10.1109/ICICS.1997.652171
Regular:

This paper addresses the task of automating the visual inspection of a strip of plastic by a vision system based on a line scan camera. The defects on the strip are characterized by a local... View More

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