IEEE - Institute of Electrical and Electronics Engineers, Inc. - New approaches of multifractal image analysis

Proceedings of 1st International Conference on Information Communications and Signal Processing

Author(s): Yuxin Liu ; Yanda Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore, Singapore
Conference Date: 12 September 1997
Volume: 2
ISBN (Paper): 0-7803-3676-3
DOI: 10.1109/ICICS.1997.652124
Regular:

Some new approaches of multifractal image analysis methods are introduced in this paper. The greatest advantage of multifractal analysis methods is the measure-dependent characteristic. After some... View More

Advertisement