IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image processing and analysis of digital speckle pattern interferometric images for monitoring/surface vibration/tilt

Proceedings of 1st International Conference on Information Communications and Signal Processing

Author(s): Chandra Shakher ; Matsuda, K. ; Tenjimbayashi, K. ; Sundarajan, N. ; Ravi, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Singapore, Singapore
Conference Date: 12 September 1997
Volume: 2
ISBN (Paper): 0-7803-3676-3
DOI: 10.1109/ICICS.1997.652120
Regular:

A digital speckle pattern interferometric system to monitor surface vibrations and out of plane tilt is presented. The resolution of the system used to measure the out of plane displacement is 1/2... View More

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