IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simultaneous extraction of thermal and emitter series resistances in bipolar transistors

Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting

Author(s): Tran, H. ; Schroter, M. ; Walkey, D.J. ; Marchesan, D. ; Smy, T.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA
Conference Date: 28 September 1997
Page(s): 170 - 173
ISBN (Paper): 0-7803-3916-9
ISSN (Paper): 1088-9299
DOI: 10.1109/BIPOL.1997.647427
Regular:

This paper describes a new method for simultaneous extraction of emitter and thermal resistance in bipolar transistors. The approach is verified using data generated by a compact model including... View More

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