IEEE - Institute of Electrical and Electronics Engineers, Inc. - 2.4 Gbit/s CML I/Os with integrated line termination resistors realized in 0.5 /spl mu/m BiCMOS technology

Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting

Author(s): Conrad, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA
Conference Date: 28 September 1997
Page(s): 120 - 122
ISBN (Paper): 0-7803-3916-9
ISSN (Paper): 1088-9299
DOI: 10.1109/BIPOL.1997.647415
Regular:

High speed interconnections for mixed analog/digital ASICs using CML with integrated line termination resistors show good performance at 2.5 Gbit/s. Several impedance controlled line terminations... View More

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