IEEE - Institute of Electrical and Electronics Engineers, Inc. - A scalable, statistical SPICE Gummel-Poon model for SiGe HBTs

Proceedings of the 1997 Bipolar/BiCMOS Circuits and Technology Meeting

Author(s): Walter, K.M. ; Ebersman, B. ; Sunderland, D.A. ; Berg, G.D. ; Freeman, G.G. ; Groves, R.A. ; Jadus, D.K. ; Harame, D.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1997
Conference Location: Minneapolis, MN, USA
Conference Date: 28 September 1997
Page(s): 32 - 35
ISBN (Paper): 0-7803-3916-9
ISSN (Paper): 1088-9299
DOI: 10.1109/BIPOL.1997.647350
Regular:

A scaleable, statistical model has been developed for SiGe HBTs. SPICE Gummel-Poon model parameters are scaled, and statistics added, using language features built into HSPICE. DC and AC fit is... View More

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